DocumentCode :
2279167
Title :
Transportability of the NML 1 Ω resistor
Author :
Pritchard, B.J.
Author_Institution :
Nat. Meas. Inst., West Lindfield, NSW
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
394
Lastpage :
395
Abstract :
A group of three 1 Omega resistors designed and fabricated at the National Measurement Institute, Australia (NMIA), were transported by air freight between NMIA and the U.S. National Institute of Standards and Technology (NIST) to quantify travel-induced changes in resistance value. The resistors were exchanged between the two laboratories in two successive cycles in 2007-2008. The average travel-induced change was less than 0.02 muOmega/Omega and the maximum change was 0.04 muOmega/Omega. The long-term drift rate of the three resistors, measured over 12 years, was less than 0.01 muOmega/Omega per year.
Keywords :
measurement standards; resistors; Australia; National Measurement Institute; U.S. National Institute of Standards and Technology; resistance 1 ohm; resistor transportability; Current measurement; Electrical resistance measurement; Laboratories; NIST; RNA; Resistors; Temperature distribution; Testing; Thermal resistance; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
Type :
conf
DOI :
10.1109/CPEM.2008.4574819
Filename :
4574819
Link To Document :
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