• DocumentCode
    2279167
  • Title

    Transportability of the NML 1 Ω resistor

  • Author

    Pritchard, B.J.

  • Author_Institution
    Nat. Meas. Inst., West Lindfield, NSW
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    394
  • Lastpage
    395
  • Abstract
    A group of three 1 Omega resistors designed and fabricated at the National Measurement Institute, Australia (NMIA), were transported by air freight between NMIA and the U.S. National Institute of Standards and Technology (NIST) to quantify travel-induced changes in resistance value. The resistors were exchanged between the two laboratories in two successive cycles in 2007-2008. The average travel-induced change was less than 0.02 muOmega/Omega and the maximum change was 0.04 muOmega/Omega. The long-term drift rate of the three resistors, measured over 12 years, was less than 0.01 muOmega/Omega per year.
  • Keywords
    measurement standards; resistors; Australia; National Measurement Institute; U.S. National Institute of Standards and Technology; resistance 1 ohm; resistor transportability; Current measurement; Electrical resistance measurement; Laboratories; NIST; RNA; Resistors; Temperature distribution; Testing; Thermal resistance; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Electronic_ISBN
    978-1-4244-2400-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574819
  • Filename
    4574819