DocumentCode
2279167
Title
Transportability of the NML 1 Ω resistor
Author
Pritchard, B.J.
Author_Institution
Nat. Meas. Inst., West Lindfield, NSW
fYear
2008
fDate
8-13 June 2008
Firstpage
394
Lastpage
395
Abstract
A group of three 1 Omega resistors designed and fabricated at the National Measurement Institute, Australia (NMIA), were transported by air freight between NMIA and the U.S. National Institute of Standards and Technology (NIST) to quantify travel-induced changes in resistance value. The resistors were exchanged between the two laboratories in two successive cycles in 2007-2008. The average travel-induced change was less than 0.02 muOmega/Omega and the maximum change was 0.04 muOmega/Omega. The long-term drift rate of the three resistors, measured over 12 years, was less than 0.01 muOmega/Omega per year.
Keywords
measurement standards; resistors; Australia; National Measurement Institute; U.S. National Institute of Standards and Technology; resistance 1 ohm; resistor transportability; Current measurement; Electrical resistance measurement; Laboratories; NIST; RNA; Resistors; Temperature distribution; Testing; Thermal resistance; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location
Broomfield, CO
Print_ISBN
978-1-4244-2399-6
Electronic_ISBN
978-1-4244-2400-9
Type
conf
DOI
10.1109/CPEM.2008.4574819
Filename
4574819
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