• DocumentCode
    2279170
  • Title

    Design and fabrication of high value standard resistors at INTI

  • Author

    Bierzychudek, M. ; Garcia, R. ; Real, M. ; Tonina, A.

  • Author_Institution
    Inst. Nac. de Tecnologfa Ind., INTI, Buenos Aires
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    396
  • Lastpage
    397
  • Abstract
    We have designed and fabricated a set of twelve high value standard resistors of 10 MOmega, 100 MOmega and 1 GOmega nominal values. A subset of three of them were measured at NIST during January, 2008, showing to have good stability and design, a short settling time and an important voltage coefficient.
  • Keywords
    electric resistance measurement; measurement standards; measurement uncertainty; resistors; INTI; NIST; high value standard resistor; measurement uncertainty; resistance 1 Gohm; resistance 10 Mohm; resistance 100 Mohm; resistance measurement; voltage coefficient; Connectors; Containers; Fabrication; Hermetic seals; Measurement standards; NIST; Resistors; Temperature; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Electronic_ISBN
    978-1-4244-2400-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574820
  • Filename
    4574820