Title :
Design and fabrication of high value standard resistors at INTI
Author :
Bierzychudek, M. ; Garcia, R. ; Real, M. ; Tonina, A.
Author_Institution :
Inst. Nac. de Tecnologfa Ind., INTI, Buenos Aires
Abstract :
We have designed and fabricated a set of twelve high value standard resistors of 10 MOmega, 100 MOmega and 1 GOmega nominal values. A subset of three of them were measured at NIST during January, 2008, showing to have good stability and design, a short settling time and an important voltage coefficient.
Keywords :
electric resistance measurement; measurement standards; measurement uncertainty; resistors; INTI; NIST; high value standard resistor; measurement uncertainty; resistance 1 Gohm; resistance 10 Mohm; resistance 100 Mohm; resistance measurement; voltage coefficient; Connectors; Containers; Fabrication; Hermetic seals; Measurement standards; NIST; Resistors; Temperature; Thermal conductivity; Thermal resistance;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574820
