DocumentCode :
227920
Title :
Comparatively plasma deposition of PEDOT thin films
Author :
Kiristi, Melek ; Bozduman, Ferhat ; Teke, Erdogan ; Uygun Oksuz, Aysegul ; Oksuz, Lutfi
Author_Institution :
Dept. of Chem., Suleyman Demirel Univ., Isparta, Turkey
fYear :
2014
fDate :
25-29 May 2014
Firstpage :
1
Lastpage :
1
Abstract :
PEDOT thin films has been widely using as electrode for variety areas because of its excellent chemical stability, low redox potential and high optical transparency in the doped states. Herein, we report that comparatively deposition of PEDOT thin film through microwave and radio frequency plasma onto ITO/glass substrate. The untreated EDOT monomer was evaporated from the outer reaction glass vessel and the substrate placed into pyrex chamber and computer-controlled plasma treatments were conducted. 2.45 GHz microwave plasma and 13.56 MHz radio frequency plasma radiations were used with continuous powers of 350 W and 50 W, respectively. Standardized experimental parameters were used and optical emission spectra (OES) were taken during the plasma process under vacuum conditions of 0.02 Torr. The deposited films were characterized by Fourier transform infrared (FTIR), Energy-dispersive X-ray Spectroscopy (EDS), Scanning Electron Microscopy (SEM), X-ray diffraction (XRD) and electrical conductivities were measured by four-point probe technique. In this study, a comparison of physical properties of plasma deposited thin films is discussed. It is showed that plasma polymerization of PEDOT resulted as crosslinked structure and electrically conductive up to 10-5 S/cm.
Keywords :
Fourier transform infrared spectra; X-ray chemical analysis; X-ray diffraction; conducting polymers; electrical conductivity; microwave materials processing; organic semiconductors; plasma deposition; polymer films; polymer structure; polymerisation; scanning electron microscopy; semiconductor growth; semiconductor thin films; ultraviolet spectra; vacuum deposition; visible spectra; EDX; FTIR; Fourier transform infrared spectra; ITO-SiO2; ITO-glass substrate; PEDOT thin films; SEM; X-ray diffraction; XRD; chemical stability; computer-controlled plasma treatments; continuous powers; crosslinked structure; doped states; electrical conductivities; electrode; energy-dispersive X-ray spectroscopy; evaporation; four-point probe technique; frequency 13.56 MHz; frequency 2.45 GHz; microwave plasma radiations; optical emission spectra; optical transparency; outer reaction glass vessel; physical properties; plasma deposition; plasma polymerization; power 350 W; power 50 W; pressure 0.02 torr; pyrex chamber; radiofrequency plasma radiations; redox potential; scanning electron microscopy; standardized experimental parameters; untreated EDOT monomer; vacuum conditions; Art; Chemistry; Educational institutions; Optical diffraction; Optical films; Plasmas;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014 IEEE 41st International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4799-2711-1
Type :
conf
DOI :
10.1109/PLASMA.2014.7012608
Filename :
7012608
Link To Document :
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