DocumentCode :
2279264
Title :
Oxide layer mass determination at the silicon sphere of the Avogadro Project
Author :
Busch, I. ; Danzebrink, H.U. ; Krumrey, M. ; Bettin, H.
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig, Germany
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
408
Lastpage :
409
Abstract :
Within the International Avogadro Project two spheres of highly enriched 28Si crystals have been produced, to perform a new determination of the Avogadro constant NA. As one of the critical tasks the mass of the oxide layer of the spheres has to be measured.
Keywords :
constants; mass measurement; silicon; Avogadro constant determination; Avogadro project; oxide layer mass determination; silicon sphere; Density measurement; Ellipsometry; Optical films; Optical surface waves; Performance evaluation; Pollution measurement; Silicon; Thickness measurement; Uncertainty; X-rays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
Type :
conf
DOI :
10.1109/CPEM.2008.4574826
Filename :
4574826
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2279264
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