• DocumentCode
    2279264
  • Title

    Oxide layer mass determination at the silicon sphere of the Avogadro Project

  • Author

    Busch, I. ; Danzebrink, H.U. ; Krumrey, M. ; Bettin, H.

  • Author_Institution
    Phys.-Tech. Bundesanstalt, Braunschweig, Germany
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    408
  • Lastpage
    409
  • Abstract
    Within the International Avogadro Project two spheres of highly enriched 28Si crystals have been produced, to perform a new determination of the Avogadro constant NA. As one of the critical tasks the mass of the oxide layer of the spheres has to be measured.
  • Keywords
    constants; mass measurement; silicon; Avogadro constant determination; Avogadro project; oxide layer mass determination; silicon sphere; Density measurement; Ellipsometry; Optical films; Optical surface waves; Performance evaluation; Pollution measurement; Silicon; Thickness measurement; Uncertainty; X-rays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Electronic_ISBN
    978-1-4244-2400-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574826
  • Filename
    4574826
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2279264