DocumentCode :
2279409
Title :
Design of a capacitive pressure sensor based on flip-chip packaging technology
Author :
Nie, Meng ; Huang, Qing-An ; Qin, Ming ; Li, Wei-Hua
Author_Institution :
Key Lab. of MEMS of Minist. of Educ., Southeast Univ., Nanjing, China
fYear :
2010
fDate :
16-19 Aug. 2010
Firstpage :
538
Lastpage :
541
Abstract :
This paper proposed a capacitive pressure sensor using flip-chip packaging technology to seal the vacuum cavity, and the sensing part is a variable capacitor with conductor/dielectric/conductor structure. Mechanical characteristics of the sensor were theoretically analyzed based on a composite membrane theory and evaluated by finite element analysis (FEA), showing that the difference of the model is within 8% compared to finite element analysis results. The back side flip-chip process can achieve wafer-level vacuum cavity packaging avoiding high voltage applied during conventional anodic bonding process and at the same time resolving the feed-through problem.
Keywords :
finite element analysis; flip-chip devices; pressure sensors; varactors; anodic bonding process; capacitive pressure sensor; composite membrane theory; conductor/dielectric/conductor structure; feed-through problem; finite element analysis; flip-chip packaging technology; flip-chip process; mechanical characteristics; variable capacitor; wafer-level vacuum cavity packaging; Biomembranes; Capacitors; Cavity resonators; Electrodes; Finite element methods; Packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-8140-8
Type :
conf
DOI :
10.1109/ICEPT.2010.5582678
Filename :
5582678
Link To Document :
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