DocumentCode :
2279448
Title :
A quantitative approach to software process management
Author :
Debou, Christophe ; Kuntzmann-Combelles, A. ; Rowe, Alison
Author_Institution :
Alcatel Austria AG, Wien, Austria
fYear :
1994
fDate :
24-26 Oct 1994
Firstpage :
26
Lastpage :
34
Abstract :
Describes real experiences of software process management based on the Software Engineering Institute´s Capability Maturity Model (SEI CMM) assessment method and the AMI (assess/analyse, metricate, improve) approach. The AMI method is a 12-step supported approach to implementing measurement. It ensures benefits for project planning and management, cost-effectiveness and match of quality objectives. The AMI project was partly funded by the Commission of the European Communities (CEC) and was led by practitioners in the European software industry. The experiences discussed in the paper follow a goal-question-metric (GQM) derived method and mix business goals defined by senior management with the results of an SEI assessment. This enables generation of action lists, with associated measurements to follow the progress of the actions. The experiments have been running at industrial sites and, although the process management initiative still has some way to go before completion, a number of major benefits have already been observed
Keywords :
DP industry; DP management; project management; research initiatives; software metrics; AMI method; Capability Maturity Model; European software industry; Software Engineering Institute; action lists; analysis; assessment method; business goals; cost-effectiveness; goal-question-metric derived method; improvement; measurement; metrication; project management; project planning; quality objective matching; quantitative approach; senior management; software process management; Ambient intelligence; Collaborative software; Computer industry; Coordinate measuring machines; Particle measurements; Production; Project management; Software measurement; Software quality; Technology management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Metrics Symposium, 1994., Proceedings of the Second International
Conference_Location :
London
Print_ISBN :
0-8186-5865-7
Type :
conf
DOI :
10.1109/METRIC.1994.344231
Filename :
344231
Link To Document :
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