Analysis of Optical Properties of Epitaxial PLZT Thin Films

Author

Echizen, Masahiro ; Kosaka, Takuya ; Fukunaga, Daiki ; Nishida, Takashi ; Uchiyama, Kiyoshi ; Shiosaki, Tadashi

Author_Institution

Nara Inst. of Sci. & Technol., Nara

fYear

2007

fDate

27-31 May 2007

Firstpage

838

Lastpage

839

Abstract

La-doped lead zirconate titanate (PLZT) has been applied to electro-optic (E-O) devices. We grew epitaxial PLZT thin films on alpha-Al₂O₃(012) single crystalline substrates fabricated by the conventional and the new sol-gel process. From result of observation by spectrophotometer, refractive index n approximately equal, were unaffected by processes. However, the average oscillator strength was different.

Keywords

electro-optical devices; epitaxial growth; ferroelectric ceramics; ferroelectric thin films; lead compounds; oscillator strengths; refractive index; spectrophotometry; PZT; electrooptic devices; epitaxial PLZT thin films; lead zirconate titanate; optical properties; oscillator strength; refractive index; sol-gel process; spectrophotometry; Crystallization; Electrooptic devices; Optical films; Optical refraction; Optical variables control; Oscillators; Refractive index; Substrates; Titanium compounds; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on

Conference_Location

Nara

ISSN

1099-4734

Print_ISBN

978-1-4244-1334-8

Electronic_ISBN

1099-4734

Type

conf

DOI

10.1109/ISAF.2007.4393420

Filename

4393420