Title :
Analysis of Optical Properties of Epitaxial PLZT Thin Films
Author :
Echizen, Masahiro ; Kosaka, Takuya ; Fukunaga, Daiki ; Nishida, Takashi ; Uchiyama, Kiyoshi ; Shiosaki, Tadashi
Author_Institution :
Nara Inst. of Sci. & Technol., Nara
Abstract :
La-doped lead zirconate titanate (PLZT) has been applied to electro-optic (E-O) devices. We grew epitaxial PLZT thin films on alpha-Al2O3(012) single crystalline substrates fabricated by the conventional and the new sol-gel process. From result of observation by spectrophotometer, refractive index n approximately equal, were unaffected by processes. However, the average oscillator strength was different.
Keywords :
electro-optical devices; epitaxial growth; ferroelectric ceramics; ferroelectric thin films; lead compounds; oscillator strengths; refractive index; spectrophotometry; PZT; electrooptic devices; epitaxial PLZT thin films; lead zirconate titanate; optical properties; oscillator strength; refractive index; sol-gel process; spectrophotometry; Crystallization; Electrooptic devices; Optical films; Optical refraction; Optical variables control; Oscillators; Refractive index; Substrates; Titanium compounds; Transistors;
Conference_Titel :
Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
Conference_Location :
Nara
Print_ISBN :
978-1-4244-1334-8
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2007.4393420
