DocumentCode :
2279454
Title :
The capability of the national institute of standards in the electromagnetic compatibility measurements
Author :
Fakhry, Sohair
Author_Institution :
Nat. Inst. of Stand., Giza
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
436
Lastpage :
437
Abstract :
The serious and increasing form of the environmental pollution due to the electromagnetic interference is a big problem in all countries. Various forms of EMI may cause electrical and electronic malfunctions, can prevent the proper use of the of the radio frequency spectrum, can ignite flammable or other hazardous atmospheres, and may even have a direct effect on human tissue. The threat of EMI is controlled by adopting the practices of electromagnetic compatibility (EMC), currently NIS-Egypt has the facilities to describe the ability of electrical and electronic devices, unit of equipment or systems to operate without interfering with other systems, also describes the ability of such systems to operate as intended within a specified electromagnetic environment according to the EMC directives which determine tests, measurements, limits and the essential requirements that products must satisfied before freely marketed . The paper gives an over view about the EMC lab at NIS showing both its functions and activities.
Keywords :
electromagnetic compatibility; electromagnetic interference; EMI; National Institute of Standards; electromagnetic compatibility measurements; electromagnetic interference; environmental pollution; hazardous atmospheres; radiofrequency spectrum; Atmosphere; Atmospheric measurements; Consumer electronics; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; Electronic equipment testing; Flammability; Pollution measurement; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
Type :
conf
DOI :
10.1109/CPEM.2008.4574840
Filename :
4574840
Link To Document :
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