DocumentCode
2279526
Title
Synthesis of combinational circuits with special fault-handling capabilities
Author
Bogliolo, Alessandro ; Damiani, Maurizio
Author_Institution
Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
fYear
1995
fDate
30 Apr-3 May 1995
Firstpage
454
Lastpage
459
Abstract
In this paper we present a new approach to the design of circuits with special properties with regards to internal faults, such as self-checking and fault-tolerant circuits. The approach is based on introducing a minimal amount of redundancy during a multilevel logic optimization process. In this process, we take advantage of the degrees of freedom associated with internal don´t care conditions, in order to minimize the amount of redundancy needed to achieve the desired fault-handling capabilities. Experimental results on several benchmark circuits are presented. They compare very favourably with traditional implementations based on topological augmentation rules
Keywords
circuit optimisation; circuit reliability; combinational circuits; design for testability; logic CAD; logic design; logic testing; multivalued logic; redundancy; combinational circuit synthesis; fault-handling capabilities; fault-tolerant circuits; internal faults; multilevel logic optimization process; redundancy; self-checking circuits; Boolean functions; Circuit faults; Circuit synthesis; Combinational circuits; Data structures; Fault tolerance; Fault tolerant systems; Logic functions; Network synthesis; Redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7000-2
Type
conf
DOI
10.1109/VTEST.1995.512674
Filename
512674
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