• DocumentCode
    2279526
  • Title

    Synthesis of combinational circuits with special fault-handling capabilities

  • Author

    Bogliolo, Alessandro ; Damiani, Maurizio

  • Author_Institution
    Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
  • fYear
    1995
  • fDate
    30 Apr-3 May 1995
  • Firstpage
    454
  • Lastpage
    459
  • Abstract
    In this paper we present a new approach to the design of circuits with special properties with regards to internal faults, such as self-checking and fault-tolerant circuits. The approach is based on introducing a minimal amount of redundancy during a multilevel logic optimization process. In this process, we take advantage of the degrees of freedom associated with internal don´t care conditions, in order to minimize the amount of redundancy needed to achieve the desired fault-handling capabilities. Experimental results on several benchmark circuits are presented. They compare very favourably with traditional implementations based on topological augmentation rules
  • Keywords
    circuit optimisation; circuit reliability; combinational circuits; design for testability; logic CAD; logic design; logic testing; multivalued logic; redundancy; combinational circuit synthesis; fault-handling capabilities; fault-tolerant circuits; internal faults; multilevel logic optimization process; redundancy; self-checking circuits; Boolean functions; Circuit faults; Circuit synthesis; Combinational circuits; Data structures; Fault tolerance; Fault tolerant systems; Logic functions; Network synthesis; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1995. Proceedings., 13th IEEE
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7000-2
  • Type

    conf

  • DOI
    10.1109/VTEST.1995.512674
  • Filename
    512674