Title :
An industry-based survey of reliability in power electronic converters
Author :
Yang, Shaoyong ; Bryant, Angus ; Mawby, Phil ; Xiang, Dawei ; Ran, Li ; Tavner, Peter
Author_Institution :
Sch. of Eng., Univ. of Warwick, Coventry, UK
Abstract :
A questionnaire survey was carried out to determine the industrial requirements and expectations of reliability in power electronic converters. According to the survey, power semiconductor devices ranked the most fragile components. It was concluded that main stresses were from the environment, transients and heavy loads, which should be considered during power electronic system design and normal operation. Further analyses suggest that power device reliability is a key issue and power electronic converter design is correlated with failure costs.
Keywords :
power convertors; power electronics; power semiconductor devices; power system reliability; industry-based survey; power device reliability; power electronic converters reliability; power electronic system design; power semiconductor devices; Converter; Failure rate; Power Electronics; Power semiconductor device; Reliability;
Conference_Titel :
Energy Conversion Congress and Exposition, 2009. ECCE 2009. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2893-9
Electronic_ISBN :
978-1-4244-2893-9
DOI :
10.1109/ECCE.2009.5316356