Title :
An experimental evaluation of the differential BICS for IDDQ testing
Author :
Weber, Walter W. ; Singh, Adit D.
Author_Institution :
Dept. of Electr. Eng., Auburn Univ., AL, USA
fDate :
30 Apr-3 May 1995
Abstract :
In this paper we present an experimental study on the effectiveness of IDDQ testing using the differential built-in current sensor (BICS) circuit. Two new test chips were designed and fabricated implementing a CMOS version of the 74181 ALU chip. In copies of this circuit we included the capability of activating 45 different “realistic” CMOS faults: inter- and intra-layer shorts and opens. We examine the fault coverage of the differential BICS for these realistic faults. A significant finding of our study is that IDDQ testing has the potential to detect several classes of “opens”. Moreover, these include precisely those open faults for which two pattern voltage tests can get invalidated because of transient switching states
Keywords :
CMOS integrated circuits; electric current measurement; electric sensing devices; fault diagnosis; integrated circuit testing; CMOS test chips; IDDQ testing; IC testing; built-in current sensor; differential BICS; fault coverage; inter-layer shorts; intra-layer shorts; opens; Circuit faults; Circuit testing; Current supplies; Electrical fault detection; Fault detection; Monitoring; Power supplies; Sampling methods; Switching circuits; Voltage;
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7000-2
DOI :
10.1109/VTEST.1995.512677
