• DocumentCode
    2279593
  • Title

    Coreless substrate for high performance flip chip packaging

  • Author

    Wang, James ; Ding, Yc ; Liao, Lia ; Yang, Penny ; Lai, Yi-Shao ; Tseng, Andy

  • Author_Institution
    Adv. Semicond. Eng., Inc., Kaohsiung, Taiwan
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    819
  • Lastpage
    823
  • Abstract
    The build-up substrates have been used for flip chip packages in high speed and high performance applications for a long time in a variety of layer stacked substrates such as 3+N+3 or 4+N+4. Because of the needs in high speed applications, the device´s frequency is running fast and the package performance need be improved to achieve such high performance demand. One of solutions is to reduce the core layer thickness from current 800 um down to 400 um or even thinner to 200 um, and it demonstrates the electrical performance has been improved. In this paper, the coreless substrate has been proposed for this study and has been use for flip chip BGA to improve the electrical performance. Coreless flip chip package has several advantages over the thick-core (800 or 400 um) package such as lower parasitic resistance, inductance and capacitance, the interconnect density is also higher for fine pitch and high I/O applications. On the other hand, the coreless package encounters warpage issue during the packaging assembly and reliability test. The properties of coreless material and package structure has been studied and discussed. Finally, the HFCBGA package with two types of dielectric substrates has been built to demonstrate the process capability and packaging robust reliability.
  • Keywords
    ball grid arrays; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; substrates; core layer thickness; coreless substrate; dielectric substrates; flip chip BGA; flip chip packaging; high I/O applications; interconnect density; layer stacked substrates; packaging assembly; reliability test; Assembly; Dielectrics; Flip chip; Packaging; Reliability; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582687
  • Filename
    5582687