DocumentCode :
2279659
Title :
Non-destructive inspection of electro-mechanical systems using micro X-ray computed tomography (proposal of CT reconstruction methods for eliminating metal artifacts)
Author :
Koseki, Michihiko ; HASHIMOTO, Shuhei ; SATO, Shinpei ; Kimura, Hitoshi ; Inou, Norio
Author_Institution :
Dept. of Mech. & Control Engineeringq, Tokyo Inst. of Technol.
fYear :
2006
fDate :
6-8 Dec. 2006
Firstpage :
739
Lastpage :
744
Abstract :
Micro computed tomography (muCT) is quite useful for quality evaluation of electro-mechanical systems because it provides three-dimensional geometrical information of internal structures. However, large differences in x-ray absorption coefficients of materials produce metal artifacts in the CT images. This study aims to develop a new reconstruction algorithm to reduce the artifacts from the images and establish a non-destructive inspection technique of electro-mechanical systems using x-ray CT imaging. This paper discusses the cause of the artifacts and proposes two algorithms to reduce them. One is direct signal conversion technique of the projection data, and the other uses two projection data based on different x-ray intensities. The authors apply the methods to several samples and discuss the efficiency of the methods.
Keywords :
X-ray imaging; computerised tomography; image reconstruction; inspection; nondestructive testing; 3D geometrical information; electromechanical systems; micro computed tomography; non-destructive inspection; x-ray CT imaging; x-ray absorption coefficients; Computed tomography; Electromagnetic wave absorption; Image reconstruction; Inorganic materials; Inspection; Optical materials; Proposals; Reconstruction algorithms; Resins; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
Conference_Location :
Singapore
Print_ISBN :
1-4244-0664-1
Electronic_ISBN :
1-4244-0665-X
Type :
conf
DOI :
10.1109/EPTC.2006.342805
Filename :
4147334
Link To Document :
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