• DocumentCode
    2279659
  • Title

    Non-destructive inspection of electro-mechanical systems using micro X-ray computed tomography (proposal of CT reconstruction methods for eliminating metal artifacts)

  • Author

    Koseki, Michihiko ; HASHIMOTO, Shuhei ; SATO, Shinpei ; Kimura, Hitoshi ; Inou, Norio

  • Author_Institution
    Dept. of Mech. & Control Engineeringq, Tokyo Inst. of Technol.
  • fYear
    2006
  • fDate
    6-8 Dec. 2006
  • Firstpage
    739
  • Lastpage
    744
  • Abstract
    Micro computed tomography (muCT) is quite useful for quality evaluation of electro-mechanical systems because it provides three-dimensional geometrical information of internal structures. However, large differences in x-ray absorption coefficients of materials produce metal artifacts in the CT images. This study aims to develop a new reconstruction algorithm to reduce the artifacts from the images and establish a non-destructive inspection technique of electro-mechanical systems using x-ray CT imaging. This paper discusses the cause of the artifacts and proposes two algorithms to reduce them. One is direct signal conversion technique of the projection data, and the other uses two projection data based on different x-ray intensities. The authors apply the methods to several samples and discuss the efficiency of the methods.
  • Keywords
    X-ray imaging; computerised tomography; image reconstruction; inspection; nondestructive testing; 3D geometrical information; electromechanical systems; micro computed tomography; non-destructive inspection; x-ray CT imaging; x-ray absorption coefficients; Computed tomography; Electromagnetic wave absorption; Image reconstruction; Inorganic materials; Inspection; Optical materials; Proposals; Reconstruction algorithms; Resins; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0664-1
  • Electronic_ISBN
    1-4244-0665-X
  • Type

    conf

  • DOI
    10.1109/EPTC.2006.342805
  • Filename
    4147334