DocumentCode
2279659
Title
Non-destructive inspection of electro-mechanical systems using micro X-ray computed tomography (proposal of CT reconstruction methods for eliminating metal artifacts)
Author
Koseki, Michihiko ; HASHIMOTO, Shuhei ; SATO, Shinpei ; Kimura, Hitoshi ; Inou, Norio
Author_Institution
Dept. of Mech. & Control Engineeringq, Tokyo Inst. of Technol.
fYear
2006
fDate
6-8 Dec. 2006
Firstpage
739
Lastpage
744
Abstract
Micro computed tomography (muCT) is quite useful for quality evaluation of electro-mechanical systems because it provides three-dimensional geometrical information of internal structures. However, large differences in x-ray absorption coefficients of materials produce metal artifacts in the CT images. This study aims to develop a new reconstruction algorithm to reduce the artifacts from the images and establish a non-destructive inspection technique of electro-mechanical systems using x-ray CT imaging. This paper discusses the cause of the artifacts and proposes two algorithms to reduce them. One is direct signal conversion technique of the projection data, and the other uses two projection data based on different x-ray intensities. The authors apply the methods to several samples and discuss the efficiency of the methods.
Keywords
X-ray imaging; computerised tomography; image reconstruction; inspection; nondestructive testing; 3D geometrical information; electromechanical systems; micro computed tomography; non-destructive inspection; x-ray CT imaging; x-ray absorption coefficients; Computed tomography; Electromagnetic wave absorption; Image reconstruction; Inorganic materials; Inspection; Optical materials; Proposals; Reconstruction algorithms; Resins; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
Conference_Location
Singapore
Print_ISBN
1-4244-0664-1
Electronic_ISBN
1-4244-0665-X
Type
conf
DOI
10.1109/EPTC.2006.342805
Filename
4147334
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