Title :
Using Support Vector Machine Regression for Measuring Electromagnetic Parameters of Magnetic Materials
Author :
Wu, Yunqiu ; Tang, Zongxi ; Zhang, Biao ; Xu, Yuehang
Author_Institution :
Univ. of Electron. Sci. & Technol. of China, Chengdu
Abstract :
A new method is proposed for electromagnetic parameters (permittivity and permeability) measurement. The microstrip transmission-line is used as measure structure, and supported vector machine (SVM) is introduced to extract actual permittivity and permeability of magnetic materials. Experiment results show that both permittivity and permeability of magnetic materials can be extracted accurately.
Keywords :
magnetic materials; magnetic permeability; magnetic permeability measurement; permittivity measurement; regression analysis; support vector machines; electromagnetic parameters; magnetic materials; microstrip transmission-line; permeability measurement; permittivity measurement; support vector machine regression; Antennas and propagation; Electromagnetic measurements; Magnetic materials; Microstrip; Microwave antennas; Microwave technology; Permeability measurement; Permittivity measurement; Support vector machines; Transmission lines; electromagnetic parameters; magnetic; support vector machine;
Conference_Titel :
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2007 International Symposium on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-4244-1045-3
Electronic_ISBN :
978-1-4244-1045-3
DOI :
10.1109/MAPE.2007.4393440
