DocumentCode :
227977
Title :
Transient thermal analysis of the microprocessor system one-dimensional thermal network with power estimation equation
Author :
Nishi, Kentaro ; Hatakeyama, T. ; Nakagawa, Sachiko ; Ishizuka, M.
Author_Institution :
AMD Japan Ltd., Tokyo, Japan
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
982
Lastpage :
989
Abstract :
This paper investigates transient temperature prediction of microprocessor hot spot by utilizing one-dimensional thermal network with average temperature nodes. Different from traditional thermal network, introduced one-dimensional thermal network in this paper consists of not only material thermal resistances and material thermal capacitances but also thermal spreading resistances and a thermal local resistance. Basic concept and construction of the thermal network are firstly introduced, one-dimensional thermal network for the microprocessor system is secondly created and transient models for heat sink fan and thermal spreading resistances are thirdly introduced to obtain sufficient temperature transient result in this paper. After that, thermal analysis is conducted with constructed one-dimensional thermal network by applying microprocessor power consumption calculated by power estimation equation which considers voltage and temperature dependency time by time. Transient thermal resistance of heat sink fan and transient thermal spreading resistances are evaluated to discuss temperature transient result. It is found that heat sink thermal resistance need to be considered to obtain more precise temperature result though obtained result has practical accuracy.
Keywords :
microprocessor chips; power consumption; thermal analysis; thermal management (packaging); thermal resistance; average temperature nodes; heat sink fan; heat sink thermal resistance; material thermal capacitances; material thermal resistances; microprocessor hot spot; microprocessor power consumption; microprocessor system; one-dimensional thermal network; power estimation equation; temperature dependency time; temperature transient result; thermal analysis; thermal local resistance; thermal spreading resistances; transient models; transient temperature prediction; transient thermal resistance; voltage dependency time; Heat sinks; Heat transfer; Resistance heating; Thermal analysis; Thermal resistance; Transient analysis; One-dimensional fin; Thermal local resistance; Thermal spreading resistance; Transient behavior; Transient thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
Conference_Location :
Orlando, FL
ISSN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2014.6892388
Filename :
6892388
Link To Document :
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