Title :
Thermal Modeling Improvements using substrate ECAD integration
Author :
Jha, Vibhash ; Hauck, T.
Author_Institution :
Freescale Semicond., Austin, TX, USA
Abstract :
With requirements of higher power density and smaller package size, thermal management of electronic packages has become increasingly challenging since last decade. With several design parameters playing an important role in evaluation of thermal characterization parameter, design approximations can lead to significant error. Substrate design is a critical aspect of the thermal model and the current state-of-the-art varies from approximate copper percentage inclusions to manually building traces to capture important geometrical features. Typically, these methods are prone to approximation errors and are also time consuming for building geometric models. An alternate method proposed is to use direct substrate ECAD integration in the package model that significantly improves the thermal modeling efficiency.
Keywords :
circuit CAD; electronic engineering computing; thermal management (packaging); approximate copper percentage inclusions; approximation errors; building geometric models; design approximations; design parameters; electronic computer-aided design; electronic packages; geometrical features; package model; package size; power density; substrate ECAD integration; substrate design; thermal characterization parameter evaluation; thermal management; thermal modeling; Copper; Electronic packaging thermal management; Junctions; Substrates; Thermal force; Thermal management; Thermal resistance; substrate ECAD model; thermal management of electronic packages;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
Conference_Location :
Orlando, FL
DOI :
10.1109/ITHERM.2014.6892391