DocumentCode
2279897
Title
RF measurements of nanoscale devices: Challenges and opportunities
Author
Burke, P.J. ; Rutherglen, C.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Irvine, CA, USA
fYear
2008
fDate
8-13 June 2008
Firstpage
494
Lastpage
495
Abstract
This invited talk will describe some of the opportunities and challenges associated with RF measurements of nanoelectronic devices.
Keywords
carbon nanotubes; nanoelectronics; nanotube devices; radiofrequency measurement; C; RF measurements; carbon nanotube; challenges; nanoelectronic devices; nanoscale devices; opportunities; Electric fields; Electric variables measurement; Electron emission; Electron optics; Frequency measurement; Impedance; Nanoscale devices; Optical saturation; Radio frequency; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location
Broomfield, CO
Print_ISBN
978-1-4244-2399-6
Electronic_ISBN
978-1-4244-2400-9
Type
conf
DOI
10.1109/CPEM.2008.4574869
Filename
4574869
Link To Document