• DocumentCode
    2279993
  • Title

    Fairness of transitions in diagnosability analysis of hybrid systems

  • Author

    Biswas, S. ; Karfa, C. ; Kanwar, H. ; Sarkar, D. ; Mukhopadhyay, S. ; Patra, A.

  • Author_Institution
    Indian Inst. of Technol., Kharagpur
  • fYear
    2006
  • fDate
    14-16 June 2006
  • Abstract
    Requirement of reliable performance in complex mission critical systems have made online detection and isolation of failures a crucial task. Failure diagnosability has been widely studied for discrete event system (DES) models. It is however shown in this work, that the diagnosability condition which has been shown to be necessary and sufficient in the DES context fails to hold in a real-world example. This is because of the abstraction employed in formulating the DES models, which obliterates an important property of the transitions namely, their fairness. In this paper, failure diagnosability for fair discrete time hybrid system (DTHS) models is discussed. The modeling framework is defined and its properties for any given measurement limitation are discussed. A definition of diagnosability of these models is adopted from the literature on DES. Based on the measurement limited model, an algorithm for construction of a diagnoser is presented. Exploiting the fairness property, the diagnosability condition is suitably modified and its necessity and sufficiency properties are formally established. Further, an algorithm for transforming a hybrid system model to another comprising fair transitions only, has been developed using fixed point computation
  • Keywords
    control system analysis; discrete event systems; discrete time systems; failure analysis; fault diagnosis; diagnosability analysis; discrete event system; discrete time hybrid system models; failure detection; failure isolation; fairness property; fixed point computation; mission critical systems; Discrete event systems; Isolation technology; Mission critical systems; State-space methods; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2006
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    1-4244-0209-3
  • Electronic_ISBN
    1-4244-0209-3
  • Type

    conf

  • DOI
    10.1109/ACC.2006.1656625
  • Filename
    1656625