• DocumentCode
    2280002
  • Title

    Scalable PEEC-SPICE modelling for EMI analysis of power electronic packages and subsystems

  • Author

    Cottet, Didier ; Paakkinen, Mikko

  • Author_Institution
    ABB Switzerland Ltd., Baden-Dattwil
  • fYear
    2006
  • fDate
    6-8 Dec. 2006
  • Firstpage
    871
  • Lastpage
    878
  • Abstract
    In this paper we present a method for scaling component and subsystem models for electromagnetic interference (EMI) analysis of power electronic systems using a SPICE simulator. The modelling is done using the partial element equivalent circuit (PEEC) method for extracting the component´s parasitic impedance matrices and to create SPICE compatible component sub-circuits. The scaling method consists of separating system components with negligible cross-coupling, combining component pins for reducing the impedance matrix sizes, and scaling the semiconductor device models to combine paralleled chips into one model. The method allows selective scaling and therefore, finding the right balance between required level of detail and computing effort. Comparisons to measurements have shown that the models are very accurate, especially at turn-off and on-state
  • Keywords
    SPICE; electromagnetic interference; electronics packaging; equivalent circuits; impedance matrix; power electronics; semiconductor device models; EMI analysis; SPICE compatible component sub-circuits; SPICE simulator; electromagnetic interference; parasitic impedance matrices; partial element equivalent circuit method; power electronic packages; power electronic systems; scalable PEEC-SPICE modelling; semiconductor device models; Analytical models; Circuit simulation; Electromagnetic analysis; Electromagnetic interference; Electromagnetic modeling; Electronics packaging; Impedance; Power electronics; Power system modeling; SPICE;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0664-1
  • Electronic_ISBN
    1-4244-0665-X
  • Type

    conf

  • DOI
    10.1109/EPTC.2006.342827
  • Filename
    4147356