DocumentCode :
2280162
Title :
Permeability and permittivity measurements using propagation and impedance of TRL calibrated microstriplines
Author :
Afsar, Mohammed N. ; McCooey, Sean ; Al-Moyaed, Nawaf ; Obol, Mahmut
Author_Institution :
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
528
Lastpage :
529
Abstract :
Numerous wireless communication devices such as integrated circuits and micro biochips are emerging in the 1 to 4 GHz frequency range. Thus it has become crucial to accurately determine the permeability and permittivity of such materials and devices in this spectral range. In this paper, we present a propagation and impedance technique for the microstripline. Three different substrates (Alumina, Silicon dioxide and Beryllium Oxide) are employed to design TRL sets for measurement purposes. The custom-designed TRL sets return losses of up to -50 dB which is the same as a standard waveguide TRL calibration.
Keywords :
alumina; beryllium compounds; calibration; electric impedance; magnetic permeability measurement; microstrip lines; permittivity measurement; silicon compounds; Al2O3; BeO; SiO2; TRL calibrated microstriplines; impedance; permeability measurements; permittivity measurements; propagation; return loss; Biological materials; Biomedical measurements; Dielectric measurements; Ferrites; Impedance; Measurement techniques; Microstrip; Nickel; Permeability measurement; Permittivity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
Type :
conf
DOI :
10.1109/CPEM.2008.4574886
Filename :
4574886
Link To Document :
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