DocumentCode :
228031
Title :
SSL and LED life prediction and assessment of CCT shift
Author :
Lall, P. ; Sakalaukus, Peter ; Junchao Wei ; Davis, Lisa
Author_Institution :
NSF-CAVE3 Electron. Res. Center, Auburn Univ., Auburn, AL, USA
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
1179
Lastpage :
1185
Abstract :
Solid-state lighting (SSL) products can have a predicted life of 70% lumen output (L70) from 26,000 to 40,000 hours using the LM-80-08 testing standards. Chromaticity shift, correlated color temperature (CCT) and lumen maintenance (LM) will dramatically reduce the nominal life of SSL luminaires. In this work, an off-the-shelf luminaire from Philips (AmbientLED) has been aged in a standard wet hot temperature operating life (WHTOL) of 85% relative humidity and 85°C (85/85) in order to assess reliability of prolonged exposer in a harsh environment. Failure criterion has been derived using the Arrhenius equation from the LM-80-08 standard, as well as the 60W LED Lamp test report from an isothermal environment of 45°C. This is a similar luminaire to the test vehicle used in this research. Data characterization between the two data sets has been carried out to determine the luminaires reliability and life under the 85/85 test conditions. This characterization allows for the determination of poor quality luminaire products in the market place. The distribution properties of the shifting mean values of CCT and LM were incorporated into the Bayesian Linear Regression (BLR) to determine the degradation pattern, in order to predict the remaining useful life (RUL) of the system due to aging before the end-of-life (EoL).
Keywords :
Bayes methods; light emitting diodes; product life cycle management; remaining life assessment; Arrhenius equation; BLR; Bayesian linear regression; CCT shift; EoL; L70; LED life prediction; LM-80-08 testing standards; Philips AmbientLED; RUL; SSL life prediction; WHTOL; chromaticity shift; correlated color temperature; end-of-life; failure criterion; lumen maintenance; remaining useful life; solidstate lighting; wet hot temperature operating life; Bayes methods; Degradation; Equations; Mathematical model; Maximum likelihood estimation; Standards; Testing; Bayesian; L70 Life; LED; Lumen Maintenance; Reliability; Solid-State Lighting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
Conference_Location :
Orlando, FL
ISSN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2014.6892413
Filename :
6892413
Link To Document :
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