Title :
Direct comparisons of ac resistance standards of various technology designs
Author :
Bounouh, A. ; Satrapinski, A. ; Ziade, F. ; Morilhat, A. ; Leprat, D.
Author_Institution :
LNE, Trappes
Abstract :
In this paper, we present results of direct AC resistance comparisons carried out at LNE with a four terminal-pair coaxial impedance bridge in 1:1 and 10:1 ratios at frequencies up to 1.6 kHz. Various ac calculable resistance standards have been used, having 1 kOmega and 10 kOmega nominal values and different technology designs. LNE standards were a coaxial straight wire resistor of Haddad type and two thin film coaxial resistors, while MIKES standards were two folded wire bifilar resistors. The whole changes in frequency of the resistance ratios are within some parts in 108.
Keywords :
electric resistance measurement; measurement standards; measurement uncertainty; thin film resistors; AC resistance standards; Haddad type resistor; LNE standards; MIKES standards; folded wire bifilar resistor; four terminal-pair coaxial impedance bridge; measurement uncertainty; resistance 1 kohm; resistance 10 kohm; resistance ratio; thin film coaxial resistor; Bridge circuits; Capacitance measurement; Coaxial components; Current measurement; Electrical resistance measurement; Frequency; Quantum capacitance; Resistors; Transistors; Wire;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574897
