Title :
Wavelet-based differential nonlinearity testing of mixed signal system ADCs
Author :
Akujuobi, Cajetan M. ; Awada, Emad ; Sadiku, Matthew ; Ali, Warsame
Author_Institution :
Center of Excellence for Commun. Syst. Technol. Res., A & M Univ., Prairie View, TX
Abstract :
This paper discusses the work done in the testing and measurement of differential nonlinearity (DNL) of analog- to-digital converters (ADCs) by applying a novel testing technique of wavelet transform. The results of the new method are compared with conventional testing methods. The wavelet transform technique shows significant advantage over the conventional techniques.
Keywords :
analogue-digital conversion; automatic testing; integrated circuit testing; mixed analogue-digital integrated circuits; wavelet transforms; analog- to-digital converters; mixed signal system ADC; wavelet transform; wavelet-based differential nonlinearity testing; Additive noise; Communications technology; Fast Fourier transforms; Histograms; Quantization; Senior members; Signal processing; System testing; Voltage; Wavelet transforms;
Conference_Titel :
SoutheastCon, 2007. Proceedings. IEEE
Conference_Location :
Richmond, VA
Print_ISBN :
1-4244-1028-2
Electronic_ISBN :
1-4244-1029-0
DOI :
10.1109/SECON.2007.342859
