Title :
A two-way Josephson voltage standard comparison between NIST and NRC
Author :
Tang, Y. ; Wood, B. ; Hamilton, C.A.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
A two-way Josephson voltage standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the National Research Council (NRC) has been conducted. The process consists of two comparisons, one using NIST designed hardware and software and the other using NRC designed hardware and software. The results of the two comparisons are in agreement to within 0.7 nV and their mean indicates that the difference between the two JVSs at 10 V is -0.28 nV with a pooled combined uncertainty of 2.07 nV (k=2).
Keywords :
measurement standards; superconducting junction devices; voltage measurement; NIST designed hardware; NIST designed software; NRC designed hardware; NRC designed software; two-way Josephson voltage standard; uncertainty; voltage 10 V; Councils; Electrical resistance measurement; Error correction; Hardware; NIST; Protocols; Software design; Switches; Uncertainty; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574922
