DocumentCode
2280779
Title
A package method for reducing bus crosstalk in full chip ESD protection circuit
Author
Bing, Zhang ; Chang-Chun, Chai ; Yin-Tang, Yang
Author_Institution
Key Lab. of Minist. of Educ. for Wide Band-Gap Semicond. Mater. & Devices, Xidian Univ., Xi´´an, China
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
1183
Lastpage
1185
Abstract
In this paper, a package method that can be applied to the full-chip electrostatic discharge (ESD) protection circuit is presented. By connecting ESD protection circuit bus, power clamp circuit bus and core circuit bus to the conductor layer of package substrate, the bus of each module in internal chip will be independent respectively, so that it can reduce the bus crosstalk effect of core circuit that is induced by ESD pulse that are discharged from ESD protection circuit, and improve the robustness of chip. The method that power clamp circuit bus connect to the conductor layer of package substrate can not only reduce the parasitic resistance of the bus, but also improve the protect efficiency of the individual power clamp circuit and reduce the quantity of the power clamp circuit and the area of chip.
Keywords
electronics packaging; electrostatic discharge; ESD protection circuit bus; bus crosstalk reduction; conductor layer; core circuit bus; electrostatic discharge; full chip ESD protection circuit; package method; package substrate; parasitic resistance reduction; power clamp circuit bus; Aluminum; Clamps; Conductors; Discharges; Electrostatic discharge; Integrated circuits; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582758
Filename
5582758
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