• DocumentCode
    2280779
  • Title

    A package method for reducing bus crosstalk in full chip ESD protection circuit

  • Author

    Bing, Zhang ; Chang-Chun, Chai ; Yin-Tang, Yang

  • Author_Institution
    Key Lab. of Minist. of Educ. for Wide Band-Gap Semicond. Mater. & Devices, Xidian Univ., Xi´´an, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    1183
  • Lastpage
    1185
  • Abstract
    In this paper, a package method that can be applied to the full-chip electrostatic discharge (ESD) protection circuit is presented. By connecting ESD protection circuit bus, power clamp circuit bus and core circuit bus to the conductor layer of package substrate, the bus of each module in internal chip will be independent respectively, so that it can reduce the bus crosstalk effect of core circuit that is induced by ESD pulse that are discharged from ESD protection circuit, and improve the robustness of chip. The method that power clamp circuit bus connect to the conductor layer of package substrate can not only reduce the parasitic resistance of the bus, but also improve the protect efficiency of the individual power clamp circuit and reduce the quantity of the power clamp circuit and the area of chip.
  • Keywords
    electronics packaging; electrostatic discharge; ESD protection circuit bus; bus crosstalk reduction; conductor layer; core circuit bus; electrostatic discharge; full chip ESD protection circuit; package method; package substrate; parasitic resistance reduction; power clamp circuit bus; Aluminum; Clamps; Conductors; Discharges; Electrostatic discharge; Integrated circuits; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582758
  • Filename
    5582758