Precise dielectric measurement of low loss materials at 60 GHz

Author

Afsar, M.N. ; Moonshiram, A. ; Yong Wang

Author_Institution

Dept of Electr. Eng. & Comput. Sci., Tufts Univ., Medford, MA, USA

fYear

2002

fDate

16-21 June 2002

Firstpage

8

Lastpage

9

Abstract

The permittivity and loss-tangent of a number of low-loss materials have been measured using the open-resonator system by two methods - the full cavity-length variation technique and the frequency variation technique. While excellent agreement and consistency in results were obtained by both methods, the measured results showed that the cavity-length technique is a little more accurate with a less-noise resonance peak profile. An extensive error analysis is made for the first time for various open resonator measurement methods for a number of specimens of different thickness.

Keywords

cavity resonators; dielectric loss measurement; dielectric resonance; error analysis; measurement uncertainty; millimetre wave measurement; permittivity measurement; 60 GHz; frequency variation techniques; full cavity-length variation techniques; loss-tangent measurement; low loss materials; measured specimen thickness; measurement accuracy; measurement uncertainty; millimetre wave measurement techniques; open resonator measurement methods error analysis; open-resonator systems; permittivity measurement; precision dielectric measurements; resonance peak profile noise; uncertainty analysis; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Error analysis; Frequency measurement; Loss measurement; Permittivity measurement; Resonance; Thickness measurement; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on

Conference_Location

Ottawa, Ontario, Canada

Print_ISBN

0-7803-7242-5

Type

conf

DOI

10.1109/CPEM.2002.1034693

Filename

1034693