DocumentCode :
2280919
Title :
Precise dielectric measurement of low loss materials at 60 GHz
Author :
Afsar, M.N. ; Moonshiram, A. ; Yong Wang
Author_Institution :
Dept of Electr. Eng. & Comput. Sci., Tufts Univ., Medford, MA, USA
fYear :
2002
fDate :
16-21 June 2002
Firstpage :
8
Lastpage :
9
Abstract :
The permittivity and loss-tangent of a number of low-loss materials have been measured using the open-resonator system by two methods - the full cavity-length variation technique and the frequency variation technique. While excellent agreement and consistency in results were obtained by both methods, the measured results showed that the cavity-length technique is a little more accurate with a less-noise resonance peak profile. An extensive error analysis is made for the first time for various open resonator measurement methods for a number of specimens of different thickness.
Keywords :
cavity resonators; dielectric loss measurement; dielectric resonance; error analysis; measurement uncertainty; millimetre wave measurement; permittivity measurement; 60 GHz; frequency variation techniques; full cavity-length variation techniques; loss-tangent measurement; low loss materials; measured specimen thickness; measurement accuracy; measurement uncertainty; millimetre wave measurement techniques; open resonator measurement methods error analysis; open-resonator systems; permittivity measurement; precision dielectric measurements; resonance peak profile noise; uncertainty analysis; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Error analysis; Frequency measurement; Loss measurement; Permittivity measurement; Resonance; Thickness measurement; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
Type :
conf
DOI :
10.1109/CPEM.2002.1034693
Filename :
1034693
Link To Document :
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