• DocumentCode
    2281015
  • Title

    Silicon dosimetry diode: neutron monitoring

  • Author

    Thakur, D.K. ; Jasuja, K.L. ; Khanna, V.K. ; Khokle, W.S. ; Bhatnagar, P.K. ; Reddy, A.R.

  • Author_Institution
    Central Electron. Eng. Res. Inst., Pilani, India
  • fYear
    1990
  • fDate
    7-12 Oct. 1990
  • Firstpage
    1658
  • Abstract
    A neutron dosimeter is a semiconductor junction device based on the degradation of the electrical properties caused by radiation damage introduced due to neutron radiations. Radiation detectors for monitoring the integrated dose of fast neutrons in radiation levels of 50 CGY to 1200 CGY and their applications in personnel dosimetry, biological dosimetry, cosmetry, and in nuclear power environments are discussed. A simplified analytical design method for a dosimeter based on existing p-n junction models is presented. The influence of resistivity, thickness of bulk silicon, and minority-carrier lifetime on the sensitivity of the silicon dosimeter is studied and compared with experimental results obtained from the developed neutron dosimeter. The neutron sensitivity is found to depend not only on thickness of base region and minority-carrier lifetime but also doping impurity.<>
  • Keywords
    dosimeters; elemental semiconductors; neutron detection and measurement; radiation monitoring; semiconductor counters; semiconductor diodes; silicon; Si diode; base region thickness; biological dosimetry; cosmetry; minority-carrier lifetime; neutron dosimeter; p-n junction models; personnel dosimetry; radiation damage; semiconductor; semiconductor junction device; sensitivity; Degradation; Design methodology; Dosimetry; Neutrons; P-n junctions; Personnel; Radiation detectors; Radiation monitoring; Semiconductor diodes; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1990., Conference Record of the 1990 IEEE
  • Conference_Location
    Seattle, WA, USA
  • Print_ISBN
    0-87942-553-9
  • Type

    conf

  • DOI
    10.1109/IAS.1990.152409
  • Filename
    152409