• DocumentCode
    2281087
  • Title

    Design-for-Reliability applications in concurrent engineering practices for electronic package development from system manufacturers´ perspectives

  • Author

    Yang, LiYu ; Niu, Rui ; Xie, Jingsong ; Qian, Bin ; Song, Baishi ; Rong, Qingan

  • Author_Institution
    Nvidia Corp, Santa Clara, CA, USA
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    1230
  • Lastpage
    1241
  • Abstract
    In today´s electronic package development cycle, activities are managed by multiple participants in the supply chain which might have different quality and reliability impacts to the end product. As a result, the reliability risk is much higher for companies who do not have insight into and/or control over the products received. Design-for-Reliability (DFR) approaches will come into play to manage the risk. In this article, DFR approaches for package development will be discussed from the perspective of the original equipment manufacturers (OEMs). DFR practices through the package development cycle will be described based on key development modules. A case study for FCBGA package development using an advanced Cu/Low-k silicon technology will be presented. Key measures to help control the quality and improve the reliability will be presented. The DFR methodology will be helpful for fabless design houses, electronics manufacturing service (EMS) partners in the supply chain, and OEMs to manage the reliability of the products.
  • Keywords
    ball grid arrays; copper; elemental semiconductors; low-k dielectric thin films; quality control; reliability; risk management; silicon; Cu-Si; Cu-low-k silicon technology; DFR approaches; EMS; FCBGA package development; OEM; concurrent engineering practices; design for reliability approach; electronic package development; electronics manufacturing service; original equipment manufacturers; quality control; supply chain; Manufacturing; Monitoring; Qualifications; Reliability engineering; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582774
  • Filename
    5582774