DocumentCode
2281087
Title
Design-for-Reliability applications in concurrent engineering practices for electronic package development from system manufacturers´ perspectives
Author
Yang, LiYu ; Niu, Rui ; Xie, Jingsong ; Qian, Bin ; Song, Baishi ; Rong, Qingan
Author_Institution
Nvidia Corp, Santa Clara, CA, USA
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
1230
Lastpage
1241
Abstract
In today´s electronic package development cycle, activities are managed by multiple participants in the supply chain which might have different quality and reliability impacts to the end product. As a result, the reliability risk is much higher for companies who do not have insight into and/or control over the products received. Design-for-Reliability (DFR) approaches will come into play to manage the risk. In this article, DFR approaches for package development will be discussed from the perspective of the original equipment manufacturers (OEMs). DFR practices through the package development cycle will be described based on key development modules. A case study for FCBGA package development using an advanced Cu/Low-k silicon technology will be presented. Key measures to help control the quality and improve the reliability will be presented. The DFR methodology will be helpful for fabless design houses, electronics manufacturing service (EMS) partners in the supply chain, and OEMs to manage the reliability of the products.
Keywords
ball grid arrays; copper; elemental semiconductors; low-k dielectric thin films; quality control; reliability; risk management; silicon; Cu-Si; Cu-low-k silicon technology; DFR approaches; EMS; FCBGA package development; OEM; concurrent engineering practices; design for reliability approach; electronic package development; electronics manufacturing service; original equipment manufacturers; quality control; supply chain; Manufacturing; Monitoring; Qualifications; Reliability engineering; Silicon; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582774
Filename
5582774
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