DocumentCode
2281184
Title
Wavelet-based measurement and classification of power quality disturbances
Author
Chen Xiangxun
Author_Institution
Electr. Power Res. Inst., Beijing, China
fYear
2002
fDate
16-21 June 2002
Firstpage
38
Lastpage
39
Abstract
This paper introduces a wavelet-based method for detecting, localizing, quantifying and classifying short duration power quality disturbances. It can take the fast dyadic scheme not the time consuming shift-invariant scheme. Novel binary features are defined and extracted from time or WT domain, and then a simple binary-decimal conversion is sufficient for classification purpose. This benefits the method in both speed and accuracy.
Keywords
harmonics; power supply quality; wavelet transforms; SDPQDs; binary-decimal conversion; classification; fast dyadic scheme; power quality disturbances; shift-invariant scheme; wavelet-based measurement; Electric variables measurement; Event detection; Frequency; Harmonic analysis; Harmonic distortion; Power harmonic filters; Power measurement; Power quality; Signal analysis; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location
Ottawa, Ontario, Canada
Print_ISBN
0-7803-7242-5
Type
conf
DOI
10.1109/CPEM.2002.1034708
Filename
1034708
Link To Document