Title :
Gamma degradation of light-emitting diodes based on heterostructures AlGaInP
Author :
Orlova, K.N. ; Gradoboev, A.V. ; Asanov, I.A.
Author_Institution :
Yurga Institute of Technology, Tomsk Polytechnic University, Yurga Russian Federation
Abstract :
Gamma degradation was investigated for AlGaInP light-emitting diodes with wavelengths in the 590 nm region. The process of degradation light output power is shown in two stages. Light-current and current-voltage characteristic of the light-emitting diodes fabricated on the basis of heterostructures with AlGaInP multiple quantum wells has possible to distinguished areas of weak and strong injection of electrons into the active region of the diodes by measuring light output. The value of the light output power of LEDs irradiated 60Co gamma-rays in a passive mode decreases with increasing radiation dose, while power of degradation of light output is directly proportional to dose and fluency and is inversely proportional to the operating current at which it measured. With reduction of radiation dose differences between the region of strong injection and weak injection increases. Comparison of the research results made of different semiconductor structures suggests that the stages of degradation processes is common to all light-emitting diodes under irradiation by fast neutrons, protons, electrons and gamma rays.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; gamma-ray effects; indium compounds; light emitting diodes; quantum well devices; semiconductor heterojunctions; semiconductor quantum wells; 60Co gamma-rays; AlGaInP; LED light output power measurement; current-voltage characteristic; diodes active region; electron injection; electrons irradiation; fast neutrons irradiation; gamma degradation; gamma rays irradiation; heterostructures-based light-emitting diode fabrication; light output power degradation; light-current characteristic; multiple quantum wells; passive mode; protons irradiation; radiation dose reduction; semiconductor structures; strong injection region; wavelength 590 nm; weak injection region; Degradation; Light emitting diodes; Power generation; Radiation effects; Radiative recombination; Semiconductor device measurement; Semiconductor diodes; AlGaInP heterostructures; light-emitting diodes with quantum wells; radiation sensitivity;
Conference_Titel :
Strategic Technology (IFOST), 2012 7th International Forum on
Conference_Location :
Tomsk
Print_ISBN :
978-1-4673-1772-6
DOI :
10.1109/IFOST.2012.6357528