• DocumentCode
    2281314
  • Title

    Reliability assessment for electromagnetic relay based on time parameters degradation

  • Author

    Xuerong, Ye ; Qiong, Yu ; Guofu, Zhai

  • Author_Institution
    Harbin Inst. of Technol., Harbin, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    1269
  • Lastpage
    1272
  • Abstract
    The traditional reliability assessment methods for electromagnetic relay (EMR) are based on censored failure-time data, which provides very little reliability information. Furthermore, this method may be unavailable in applications with few or no failures. Actually, many time parameters of electromagnetic relay, such as closing time, over-travel time provide an obvious degradation process during the life test. By testing time parameters of EMR during its life circle, this paper presents a novel reliability assessment method of EMR based on multiple time parameters degradation and multiple failure mechanism. Considering the difference of EMR degradation, regression analysis method and time series method are employed to build the degradation model of time parameters for EMR. Then, multiple degradation parameters reliability assessment model which can evaluate the reliability of all failure mechanisms is developed with stochastic theory.
  • Keywords
    electromagnetic devices; regression analysis; relays; reliability; stochastic processes; time series; EMR degradation; electromagnetic relay; multiple failure mechanism; multiple time parameters degradation; regression analysis; reliability assessment; stochastic theory; time series method; Contamination; Degradation; Failure analysis; Materials; Relays; Reliability theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582785
  • Filename
    5582785