DocumentCode
2281314
Title
Reliability assessment for electromagnetic relay based on time parameters degradation
Author
Xuerong, Ye ; Qiong, Yu ; Guofu, Zhai
Author_Institution
Harbin Inst. of Technol., Harbin, China
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
1269
Lastpage
1272
Abstract
The traditional reliability assessment methods for electromagnetic relay (EMR) are based on censored failure-time data, which provides very little reliability information. Furthermore, this method may be unavailable in applications with few or no failures. Actually, many time parameters of electromagnetic relay, such as closing time, over-travel time provide an obvious degradation process during the life test. By testing time parameters of EMR during its life circle, this paper presents a novel reliability assessment method of EMR based on multiple time parameters degradation and multiple failure mechanism. Considering the difference of EMR degradation, regression analysis method and time series method are employed to build the degradation model of time parameters for EMR. Then, multiple degradation parameters reliability assessment model which can evaluate the reliability of all failure mechanisms is developed with stochastic theory.
Keywords
electromagnetic devices; regression analysis; relays; reliability; stochastic processes; time series; EMR degradation; electromagnetic relay; multiple failure mechanism; multiple time parameters degradation; regression analysis; reliability assessment; stochastic theory; time series method; Contamination; Degradation; Failure analysis; Materials; Relays; Reliability theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582785
Filename
5582785
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