• DocumentCode
    2281335
  • Title

    Improvement in the volume determination for Si spheres with an optical interferometer

  • Author

    Kuramoto, N. ; Fujii, K.

  • Author_Institution
    Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    664
  • Lastpage
    665
  • Abstract
    Accurate volume measurements for silicon spheres by optical interferometers play an important role in the determination of the Avogadro constant by the X-ray crystal density method. To reduce the uncertainty in the volume determination, a new vacuum chamber with a radiation shield has been developed. A new sphere temperature measurement system has been also introduced. Details of the improvements are described.
  • Keywords
    elemental semiconductors; light interferometers; shapes (structures); silicon; temperature measurement; vacuum apparatus; volume measurement; Si; optical interferometer; radiation shield; silicon spheres; sphere temperature measurement system; vacuum chamber; volume determination; volume measurements; Atomic measurements; Copper; Frequency; Laser tuning; Optical interferometry; Optical tuning; Silicon; Temperature control; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Electronic_ISBN
    978-1-4244-2400-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574954
  • Filename
    4574954