DocumentCode
2281539
Title
Traceability of capacitance measurements at NMI VSL
Author
Dierikx, E.F.
Author_Institution
NMi Van Swinden Lab., Delft
fYear
2008
fDate
8-13 June 2008
Firstpage
690
Lastpage
691
Abstract
NMi VSL is working on its independent realization of the unit of capacitance (F). The traceability will be derived from the DC quantum hall resistance standard. This paper focuses on a quadrature bridge that has recently been completed. The first results obtained from the bridge show an agreement with the NMi VSL reference group of capacitors within 1 muF/F.
Keywords
bridge instruments; capacitance measurement; electric resistance measurement; measurement standards; quantum Hall effect; units (measurement); DC quantum hall resistance standard; NMi VSL reference group; capacitance measurement; quadrature bridge; traceability chart; unit-of-capacitance; Bridge circuits; Capacitance measurement; Capacitors; Electrical resistance measurement; Impedance; Laboratories; Manufacturing; Oil insulation; Quantum capacitance; Resistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location
Broomfield, CO
Print_ISBN
978-1-4244-2399-6
Electronic_ISBN
978-1-4244-2400-9
Type
conf
DOI
10.1109/CPEM.2008.4574967
Filename
4574967
Link To Document