DocumentCode :
2281539
Title :
Traceability of capacitance measurements at NMI VSL
Author :
Dierikx, E.F.
Author_Institution :
NMi Van Swinden Lab., Delft
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
690
Lastpage :
691
Abstract :
NMi VSL is working on its independent realization of the unit of capacitance (F). The traceability will be derived from the DC quantum hall resistance standard. This paper focuses on a quadrature bridge that has recently been completed. The first results obtained from the bridge show an agreement with the NMi VSL reference group of capacitors within 1 muF/F.
Keywords :
bridge instruments; capacitance measurement; electric resistance measurement; measurement standards; quantum Hall effect; units (measurement); DC quantum hall resistance standard; NMi VSL reference group; capacitance measurement; quadrature bridge; traceability chart; unit-of-capacitance; Bridge circuits; Capacitance measurement; Capacitors; Electrical resistance measurement; Impedance; Laboratories; Manufacturing; Oil insulation; Quantum capacitance; Resistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
Type :
conf
DOI :
10.1109/CPEM.2008.4574967
Filename :
4574967
Link To Document :
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