DocumentCode
2281672
Title
Material characterization using a quasi-optical measurement system
Author
Gagnon, N. ; Shaker, J. ; Berini, P. ; Roy, L. ; Petosa, A.
Author_Institution
Commun. Res. Centre, Ottawa, Ont., Canada
fYear
2002
fDate
16-21 June 2002
Firstpage
104
Lastpage
105
Abstract
Application of a quasi-optical apparatus in the determination of the constituent parameters of materials is presented in this paper. Correction terms are introduced to remove the errors due to the misplacement of the sample and the calibration procedure. Good agreement was observed between manufacturer specifications and measurements after application of the correction terms.
Keywords
calibration; measurement errors; permittivity measurement; calibration; dielectric constant; dielectric material; measurement error; quasi-optical measurement system; Antenna measurements; Calibration; Dielectric constant; Dielectric materials; Dielectric measurements; Lenses; Manufacturing; Optical reflection; Performance evaluation; Phase measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location
Ottawa, Ontario, Canada
Print_ISBN
0-7803-7242-5
Type
conf
DOI
10.1109/CPEM.2002.1034741
Filename
1034741
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