DocumentCode
2281847
Title
Influence of calibration uncertainties on VNA S-parameter measurements
Author
Stumper, U.
Author_Institution
Phys.-Technische Bundesanstalt, Braunschweig, Germany
fYear
2002
fDate
16-21 June 2002
Firstpage
132
Lastpage
133
Abstract
For the widespread 12-term TMSO calibration of 4-sampler vector network analyzers (VNAs), the sensitivity coefficients of the S-parameters of two-ports are derived with respect to the deviations of the reflection coefficients of the one-port calibration standards used. The obtained expressions are suitable for the establishment of the uncertainty budget.
Keywords
S-parameters; UHF measurement; calibration; measurement standards; microwave measurement; network analysers; two-port networks; 4-sampler vector network analyzers; S-parameter measurements; TMSO calibration; VNA; calibration uncertainties; one-port calibration standards; reflection coefficients; sensitivity coefficients; two-ports; uncertainty budget; Attenuation; Attenuators; Calibration; Circuits; Equations; Erbium; Measurement standards; Reflection; Scattering parameters; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location
Ottawa, Ontario, Canada
Print_ISBN
0-7803-7242-5
Type
conf
DOI
10.1109/CPEM.2002.1034753
Filename
1034753
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