DocumentCode
2281959
Title
Problems and solutions applying high speed fuses in the past and the future
Author
Andersen, Niels C.
Author_Institution
Bussmann Div., Copper Ind., St. Louis, MO, USA
fYear
1990
fDate
7-12 Oct. 1990
Firstpage
1695
Abstract
The development of high-speed fuses for the protection of high-power semiconductors is reviewed. The North American and European standards for the high-speed fuses are compared, and the effects of the different sets of standards are discussed.<>
Keywords
electric fuses; protection; standards; European standards; North American standards; high speed fuses; high-power semiconductor protection; Aluminum; Copper; Digital TV; Fuses; Protection; Semiconductor diodes; Silver; Solid state circuits; Thyristors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 1990., Conference Record of the 1990 IEEE
Conference_Location
Seattle, WA, USA
Print_ISBN
0-87942-553-9
Type
conf
DOI
10.1109/IAS.1990.152414
Filename
152414
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