DocumentCode :
2282180
Title :
Inter-scale Correlation Image Denoising Based on Non-aliasing Contourlet Transform
Author :
Yan He ; Chen Feng ; Li Wei-wei
Author_Institution :
Coll. of Comput. Sci., Chongqing Univ. of Technol., Chongqing, China
Volume :
2
fYear :
2010
fDate :
13-14 March 2010
Firstpage :
516
Lastpage :
519
Abstract :
A novel image denoising method based on non-aliasing Contourlet transform(NACT) is presented according to coefficient inter-scale correlation. A noisy image was decomposed into a low frequency approximation sub-image and a series of high frequency detail sub-images at different scale and direction via NACT. In the transform domain, the inter-scale correlation of the signal coefficients was strong, and there was weak inter-scale correlation for noise coefficients, so the noise in the high frequency detail sub-images was removed by using of non-Gaussian bivariate model. Experimental results show that the proposed scheme has higher operational efficiency, and it can overcome the aliasing in Contourlet transform and avoid ¿scratching¿ phenomenon in the reconstructed image. Whether PSNR index or in visual effect, the proposed scheme outperforms the traditional Contourlet transform denoising, Contourlet domain HMT denoising and the hard threshold denoising based on no-aliasing Contourlet transform, and can achieve an excellent balance between suppress noise effectively and preserve as many image details and edges as possible.
Keywords :
Gaussian processes; correlation theory; image denoising; image reconstruction; transforms; NACT; PSNR; contourlet domain HMT denoising; contourlet transform denoising; hard threshold denoising; image decomposition; image reconstruction; interscale correlation image denoising; noise coefficients; noisy image; nonGaussian bivariate model; nonaliasing contourlet transform; subimage approximation; Automation; Image denoising; Mechatronics; image denoising; inter-scale correlation; non-Gaussian bivariate model; the non-aliasing Contourlet transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
Conference_Location :
Changsha City
Print_ISBN :
978-1-4244-5001-5
Electronic_ISBN :
978-1-4244-5739-7
Type :
conf
DOI :
10.1109/ICMTMA.2010.241
Filename :
5458844
Link To Document :
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