• DocumentCode
    2282873
  • Title

    Design of high reliability packaging for Fuji High Power Module

  • Author

    Igarashi, S. ; Kakiki, H. ; Nishimura, Y. ; Goto, T.

  • Author_Institution
    Electron. Devices Bus. Headquarters, Fuji Electr. Co. Ltd., Nagano, Japan
  • fYear
    2011
  • fDate
    20-23 Aug. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Fuji Electric has been involved in efforts to develop innovative power electronics technology, which is crucial for protecting the global environment and the reduction of carbon dioxide emission. 6th Generation IGBT (V-IGBT) has been developed as a key device for innovative power converters. Recently, demand for High Power application increases in such as the wind-power generation and Traction converter. Therefore Fuji Electric concentrates to develop the 6th Generation High Power IGBT Module series. The new Fuji High Power Module had applied the high reliability package technologies such as the terminal bonding with ultrasonic welding and newly solder material between DBC and base plate. The new Fuji High Power Module will contribute to make the large capacity power electronics equipment, especially for applications such as line connection inverter for renewal energy system and large capacity AC drive system highly efficient and long life.
  • Keywords
    bipolar integrated circuits; field effect integrated circuits; insulated gate bipolar transistors; integrated circuit packaging; integrated circuit reliability; power integrated circuits; soldering; ultrasonic welding; DBC; Fuji Electric; base plate; high power module; high reliability packaging; power electronics technology; sixth generation high power IGBT module; solder material; terminal bonding; ultrasonic welding; Acoustics; Bonding; Copper; Insulated gate bipolar transistors; Multichip modules; Welding; FS-Trench-IGBT; High reliability; Solder material; Ultrasonic welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Machines and Systems (ICEMS), 2011 International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4577-1044-5
  • Type

    conf

  • DOI
    10.1109/ICEMS.2011.6073948
  • Filename
    6073948