Title :
A novel method of improving transition delay fault coverage using multiple scan enable signals
Author :
Devtaprasanna, N. ; Gunda, A. ; Krishnamurthy, P. ; Reddy, S.M. ; Pomeranz, I.
Author_Institution :
Dept. of ECE, Iowa Univ., USA
Abstract :
We propose a novel delay test method for achieving higher delay fault coverage. Multiple scan enable signals are used none of which require the ability to switch at-speed between launch and capture cycles.
Keywords :
automatic test pattern generation; boundary scan testing; fault simulation; flip-flops; integrated circuit testing; delay test method; multiple scan enable signals; transition delay fault coverage; Circuit faults; Circuit testing; Delay; Design methodology; Electrical fault detection; Fault detection; Flip-flops; Integrated circuit testing; Signal design; Switches;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on
Print_ISBN :
0-7695-2451-6
DOI :
10.1109/ICCD.2005.13
