DocumentCode
2283008
Title
Key comparisons for dummies: lessons learned
Author
Jarrett, D.G.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
2002
fDate
16-21 June 2002
Firstpage
268
Lastpage
269
Abstract
This paper will discuss some of the challenges encountered during a recent key comparison. From these experiences, general lessons will be drawn that should prove useful both for the consultative committees and for future pilot laboratories as they consider organization of future key comparisons.
Keywords
measurement standards; consultative committees; dummies; key comparison; mutual recognition arrangement; national metrology institutes; pilot laboratories; Continuing education; Energy management; Guidelines; International trade; Laboratories; Metrology; NIST; Particle measurements; Phase measurement; Protocols;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location
Ottawa, Ontario, Canada
Print_ISBN
0-7803-7242-5
Type
conf
DOI
10.1109/CPEM.2002.1034825
Filename
1034825
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