DocumentCode :
2283065
Title :
Considerations for SIMOX low voltage applications
Author :
Alles, M. ; Krull, W.
Author_Institution :
Ibis Technol. Corp., Danvers, MA, USA
fYear :
1993
fDate :
5-7 Oct 1993
Firstpage :
102
Lastpage :
103
Abstract :
The IC industry move to low voltage presents an opportunity to which SIMOX is well suited. In particular, process simplification related to junction engineering and material cost reduction related to use of thinner buried oxide (BOX) are opportunities to enhance the serious commercialization of SIMOX for low voltage applications. This work addresses issues relevant to the application of present and next generation SIMOX materials and devices to low voltage applications. Advantages of SIMOX operation at low voltage are examined, and results of an analytical analysis of the effects of BOX thickness on associated parasitic capacitances are presented. The analysis shows that SIMOX on P-type substrates maintain the reduced capacitance advantages as the BOX is thinned
Keywords :
SIMOX; BOX; IC industry; P-type substrates; SIMOX devices; SIMOX materials; buried oxide; commercialization; junction engineering; low voltage applications; material cost; parasitic capacitances; process simplification; Commercialization; Costs; Dielectric substrates; FETs; Impact ionization; Low voltage; Parasitic capacitance; Performance analysis; Silicon; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1993. Proceedings., 1993 IEEE International
Conference_Location :
Palm Springs, CA
Print_ISBN :
0-7803-1346-1
Type :
conf
DOI :
10.1109/SOI.1993.344542
Filename :
344542
Link To Document :
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