• DocumentCode
    2283150
  • Title

    Benefits and costs of power-gating technique

  • Author

    Hailin Jiang ; Marek-Sadowska, M. ; Nassif, S.R.

  • Author_Institution
    ECE Dept., UCSB, Santa Barbara, CA, USA
  • fYear
    2005
  • fDate
    2-5 Oct. 2005
  • Firstpage
    559
  • Lastpage
    566
  • Abstract
    Power-gating is a technique for saving leakage power by shutting off the idle blocks. However, without good understanding and careful design, negative effects of power gating may overwhelm the potential gain and may make the technique not worth the effort. In this paper, we report on our study of the benefits and costs of the power-gating technique in terms of power, area, and performance. We model and analyze several strongly related parameters such as sleep-transistor size, decap area, and supply voltage level. We also report on our experiments to demonstrate how the gated area, circuit behavior and power mesh granularity affect the power gating technique at the system level. Experimental results show that, by compromising 4% of the total area and 5% of the dynamic power, we can achieve 47% leakage power saving while maintaining the same performance. With technology scaling down, the saving is significant. We conclude that we can benefit from the power-gating technique in future technology nodes.
  • Keywords
    integrated circuit design; leakage currents; low-power electronics; phase locked loops; transistors; voltage regulators; decap area; leakage power saving; power mesh granularity; power-gating technique; sleep-transistor size; supply voltage level; CMOS logic circuits; CMOS process; CMOS technology; Circuit testing; Leakage current; Power dissipation; Power supplies; Power system modeling; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-7695-2451-6
  • Type

    conf

  • DOI
    10.1109/ICCD.2005.34
  • Filename
    1524207