Title :
Benefits and costs of power-gating technique
Author :
Hailin Jiang ; Marek-Sadowska, M. ; Nassif, S.R.
Author_Institution :
ECE Dept., UCSB, Santa Barbara, CA, USA
Abstract :
Power-gating is a technique for saving leakage power by shutting off the idle blocks. However, without good understanding and careful design, negative effects of power gating may overwhelm the potential gain and may make the technique not worth the effort. In this paper, we report on our study of the benefits and costs of the power-gating technique in terms of power, area, and performance. We model and analyze several strongly related parameters such as sleep-transistor size, decap area, and supply voltage level. We also report on our experiments to demonstrate how the gated area, circuit behavior and power mesh granularity affect the power gating technique at the system level. Experimental results show that, by compromising 4% of the total area and 5% of the dynamic power, we can achieve 47% leakage power saving while maintaining the same performance. With technology scaling down, the saving is significant. We conclude that we can benefit from the power-gating technique in future technology nodes.
Keywords :
integrated circuit design; leakage currents; low-power electronics; phase locked loops; transistors; voltage regulators; decap area; leakage power saving; power mesh granularity; power-gating technique; sleep-transistor size; supply voltage level; CMOS logic circuits; CMOS process; CMOS technology; Circuit testing; Leakage current; Power dissipation; Power supplies; Power system modeling; Threshold voltage; Very large scale integration;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7695-2451-6
DOI :
10.1109/ICCD.2005.34