• DocumentCode
    2283177
  • Title

    Experimental Investigation and Empirical Modeling of the Set and Reset Kinetics of Ag-GeS2 Conductive Bridging Memories

  • Author

    Palma, G. ; Vianello, E. ; Cagli, C. ; Molas, G. ; Reyboz, M. ; Blaise, P. ; De Salvo, B. ; Longnos, F. ; Dahmani, F.

  • Author_Institution
    LETI, CEA, Grenoble, France
  • fYear
    2012
  • fDate
    20-23 May 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we present a new empirical model able to explain the main features of set and reset processes in Ag-GeS2 Conductive Bridging Memories. The model is carefully validated on a wide number of experimental data, precisely designed for this scope. In particular, electrical tests were performed both in quasi static and in pulse modes on industrial CBRAM cells. The simulations here reported provide new insights on the device operations as well as clear indications for the development of CBRAM compact-modeling suitable for design implementation.
  • Keywords
    germanium compounds; random-access storage; silver; Ag-GeS2; Ag-GeS2 conductive bridging memories; conductive bridging random access memories; electrical test; industrial CBRAM cell; pulse modes; quasistatic modes; reset kinetics; Data models; Electrodes; Kinetic theory; Resistance; Solids; Switches; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Workshop (IMW), 2012 4th IEEE International
  • Conference_Location
    Milan
  • Print_ISBN
    978-1-4673-1079-6
  • Type

    conf

  • DOI
    10.1109/IMW.2012.6213680
  • Filename
    6213680