Title :
The Si-route to the Avogadro constant: new measurements of the molar volume and lattice parameter in an integrated international approach
Author :
De Bievre, P. ; Valkiers, S. ; Kessel, R. ; Taylor, P.D.P. ; Becker, P. ; Bettin, H. ; Kuetgens, U. ; Nicolaus, A. ; Fujii, K. ; Waseda, A. ; Mana, G. ; Peuto, A. ; Kenny, M.J. ; Zosi, G. ; Spaepen, F.
Author_Institution :
Inst. for Reference Mater. & Measurements, Eur. Cornmission-JRC, Geel, Belgium
Abstract :
New measurements of the molar volume and lattice parameter of Si, in near-perfect Si crystals, are reported and discussed. These measurements have been planned and performed within a worldwide collaboration coordinated by the CCM working group on the Avogadro constant. The present determination of the molar volume, does confirm the value published previously within stated uncertainty.
Keywords :
crystals; density measurement; elemental semiconductors; lattice constants; silicon; Avogadro constant; Si; Si crystals; integrated international approach; lattice parameter measurements; molar volume measurements; worldwide collaboration; Atomic measurements; Collaborative work; Coordinate measuring machines; Crystals; Density measurement; Isotopes; Lattices; Metrology; Performance evaluation; Volume measurement;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034835
