• DocumentCode
    2283242
  • Title

    Flotation measurements to reveal the reason for the discrepancy in the molar volume of silicon

  • Author

    Bettin, H. ; Toth, H.

  • Author_Institution
    Phys. Tech. Bundesanstalt, Braunschweig, Germany
  • fYear
    2002
  • fDate
    16-21 June 2002
  • Firstpage
    298
  • Lastpage
    299
  • Abstract
    Silicon single crystals are used to determine the Avogadro constant on the basis of the ratio of molar volume and atomic volume. To reveal the reason for the discrepancy in the molar volume of silicon found in crystals of different origin, the densities of crystals grown under different conditions were compared using a flotation method. The method and the results obtained are reported and the uncertainty is discussed.
  • Keywords
    constants; crystals; density measurement; measurement uncertainty; silicon; Avogadro constant determination; Si; Si crystal molar volume discrepancy; crystal growth; measurement uncertainty; molar volume/atomic volume ratio; silicon single crystal flotation density measurements; Calibration; Crystals; Density measurement; Electrical resistance measurement; Pressure measurement; Silicon; Solids; Temperature; Thermal expansion; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
  • Conference_Location
    Ottawa, Ontario, Canada
  • Print_ISBN
    0-7803-7242-5
  • Type

    conf

  • DOI
    10.1109/CPEM.2002.1034839
  • Filename
    1034839