Abstract :
The following topics are dealt with: allocation and scheduling for MPSoCs and NoCs; power grid analysis; large interconnect network analysis; online testing; fault tolerance; model based design and test; transaction level modeling based validation; application specific network-on-chip design; systematic analogue design automation; soft error analysis; concurrent testing; processor and memory design; reconfigurable computing; design for manufacturability; design for yield; analogue and mixed-signal design; processor self-test; fault diagnosis; system level modelling and simulation; power-efficient hardware/software architectures; timing and noise analysis; automotive systems; NoC architectures; low power embedded architectures and platforms; transistor and gate level simulation; system optimisation with embedded software; communication-centric synthesis for MPSoC; clocks and routing; nanotechnology circuits reliability; thermal aspects of low power design; dynamic power aware logic design; defect modeling and detection; data layout optimizations; wireless sensor networks; test data compression; resource constrained scheduling; sequential optimisation, clocking and Boolean matching; semi-formal validation methods; memory, FPGA. and networks-on-chip testing; architectural level synthesis; system level verification; reliable microarchitectures; logic and arithmetic circuit optimisation
Keywords :
automotive electronics; circuit optimisation; design for manufacture; electronic design automation; fault simulation; field programmable gate arrays; formal verification; hardware-software codesign; integrated circuit reliability; integrated circuit testing; integrated memory circuits; logic design; low-power electronics; network-on-chip; reconfigurable architectures; wireless sensor networks; Boolean matching; FPGA testing; NoC architectures; analogue design automation; application specific network-on-chip design; architectural level synthesis; arithmetic circuit optimisation; automotive systems; concurrent testing; data layout optimizations; defect modeling; design for manufacturability; design for yield; dynamic power aware logic design; embedded software; fault diagnosis; fault tolerance; hardware/software architectures; interconnect network analysis; logic circuit optimisation; low power design; low power embedded architectures; memory design; memory testing; mixed-signal design; model based design; multiprocessor system-on-chip; nanotechnology circuits reliability; noise analysis; online testing; power grid analysis; processor design; processor self-test; reconfigurable computing; resource constrained scheduling; semi-formal validation methods; sequential optimisation; soft error analysis; system level verification; test data compression; timing analysis; transaction level modeling; wireless sensor networks;
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
DOI :
10.1109/DATE.2006.243941