Title :
Nano-scale integrity and coherence of the S.I
Author :
Milton, M.J.T. ; Cumpson, P.J.
Author_Institution :
Centre for Opt. & Anal. Meas., Nat. Phys. Lab., Teddington, UK
Abstract :
Traceable measurements at the nano-scale are usually made by establishing links to the scale of the S.I. base units all of which are defined at the macro-scale. We report the results of a study into the implications of the burgeoning developments in nano-technology on the realisation of S.I. quantities at the nano-scale.
Keywords :
stability; units (measurement); S.I. base units; coherence; nano-scale integrity; nano-technology; traceable measurements; Atomic force microscopy; Bonding; Force measurement; Laboratories; Lattices;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034848
