DocumentCode
2283395
Title
Nano-scale integrity and coherence of the S.I
Author
Milton, M.J.T. ; Cumpson, P.J.
Author_Institution
Centre for Opt. & Anal. Meas., Nat. Phys. Lab., Teddington, UK
fYear
2002
fDate
16-21 June 2002
Firstpage
316
Abstract
Traceable measurements at the nano-scale are usually made by establishing links to the scale of the S.I. base units all of which are defined at the macro-scale. We report the results of a study into the implications of the burgeoning developments in nano-technology on the realisation of S.I. quantities at the nano-scale.
Keywords
stability; units (measurement); S.I. base units; coherence; nano-scale integrity; nano-technology; traceable measurements; Atomic force microscopy; Bonding; Force measurement; Laboratories; Lattices;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location
Ottawa, Ontario, Canada
Print_ISBN
0-7803-7242-5
Type
conf
DOI
10.1109/CPEM.2002.1034848
Filename
1034848
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