DocumentCode :
228340
Title :
High performance low leakage power full adder circuit design using rate sensing keeper
Author :
Ajayan, J. ; Nirmal, D. ; Sivaranjani, D. ; Sivasankari, S. ; Manikandan, M.
Author_Institution :
Dept. of ECE, MIT, Pondicherry, India
fYear :
2014
fDate :
13-14 Feb. 2014
Firstpage :
1
Lastpage :
6
Abstract :
The CMOS technology plays a major role on the performance of microprocessors on very large scale integrated circuit chips. The rapid growth in CMOS technology with the shrinking transistor size towards 16 nm has allowed for placement of several billions of transistors on a single microprocessor chip. This also leads to reduce the delay of logic gates in the order of pico seconds. One such method to improve the performance of microprocessor is to optimize the timing performance of dynamic circuits. In this paper a full adder circuit is designed and simulated using rate sensing keeper technique with L=0.12 μm technology and VDD=1.2 V for improving the timing and noise tolerance also the noise tolerance characteristics of the full adder circuit designed using rate sensing keeper is compared with twin transistor based full adder circuit.
Keywords :
CMOS logic circuits; adders; integrated circuit design; logic design; logic gates; microprocessor chips; CMOS technology; dynamic circuits; full adder circuit design; logic gates; low leakage power; microprocessor chip; noise tolerance; rate sensing keeper technique; size 0.12 mum; size 16 nm; twin transistor based full adder circuit; very large scale integrated circuit chips; voltage 1.2 V; Clocks; Logic gates; MOSFET; Timing; Bias; Domino logic; noise tolerance; rate sensing; timing optimization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Communication Systems (ICECS), 2014 International Conference on
Conference_Location :
Coimbatore
Print_ISBN :
978-1-4799-2321-2
Type :
conf
DOI :
10.1109/ECS.2014.6892569
Filename :
6892569
Link To Document :
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