Title :
Two ions in one trap: ultra-high precision mass spectrometry?
Author :
Rainville, S. ; Thompson, J.K. ; Pritchard, D.E.
Author_Institution :
Dept. of Phys., MIT, Cambridge, MA, USA
Abstract :
By simultaneously trapping two different ions in a Penning trap, we compared their cyclotron frequencies (whose ratio gives their atomic mass ratio) with a precision of about 10/sup -11/ in only a few hours. Unfortunately we observed large abrupt changes in the ratio for which we do not have an explanation.
Keywords :
atomic mass; mass spectra; mass spectroscopy; particle traps; trapped ions; Penning trap; abrupt ratio changes; atomic mass ratio; cyclotron frequencies; ion trapping; ultra-high precision mass spectrometry; Atomic measurements; Chemical processes; Cyclotrons; Fluctuations; Frequency measurement; Magnetic field measurement; Mass spectroscopy; Metrology; Neutrino sources; Physics;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034849
