DocumentCode :
2283522
Title :
Surface cleaning techniques and efficient B-field profiles for lithium ion sources on extraction ion diodes
Author :
Cuneo, M.E. ; Menge, P.R. ; Hanson, D.L. ; Bailey, J.E. ; Bernard, M.A. ; Desjarlais, M.P. ; Filuk, A.B. ; Fowler, W.E. ; Lockner, T.R. ; Nash, T.J. ; Noack, D.D. ; Slutz, S.A. ; Ziska, G.R.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
1995
fDate :
5-8 June 1995
Firstpage :
178
Abstract :
Summary form only given. Application of ion beams to inertial confinement fusion requires efficient production, transport and focusing of an intense, low microdivergence beam of an appropriate range ion. At Sandia, we are studying the production of lithium ion beams in extraction applied-B ion diodes on the SABRE accelerator (5 MV, 250 kA). Evidence on both SABRE (1 TW) and PBFA-II (20 TW) indicates that the lithium beam turns off and is replaced by a beam of mostly protons and carbon, possibly due to election thermal and stimulated desorption of hydrocarbon surface contamination with subsequent avalanche ionization. Turn-off of the lithium beam is accompanied by rapid impedance collapse. Surface cleaning techniques are being developed to reduce beam contamination, increase the total lithium energy and reduce the rate of diode impedance collapse. Application of surface cleaning techniques has increased the production of lithium from passive LiF sources by a factor of 2. Improved diode electric and magnetic field profiles have increased the diode efficiency and production of lithium by a factor of 5, without surface cleaning. Work is ongoing to combine these two advances. Our principal surface cleaning technique consists of 13.5 MHz RF and RF-assisted discharges for efficient physical and chemical sputtering of surface impurities from both the anode and cathode.
Keywords :
beam handling techniques; electron stimulated desorption; ion beams; ion sources; lithium; particle beam focusing; plasma diodes; sputtering; surface cleaning; thermally stimulated desorption; 1 TW; 13.5 MHz; 20 TW; 250 kA; 5 MV; B-field profiles; Li; Li beam turn-off; Li ion sources; PBFA-II; RF discharges; SABRE accelerator; avalanche ionization; beam contamination reduction; chemical sputtering; election thermal desorption; electric field profiles; extraction ion diodes; hydrocarbon surface contamination; inertial confinement fusion; intense low microdivergence ion beam; ion beam focusing; ion beam production; ion beam transport; ion beams; magnetic field profiles; passive LiF sources; physical sputtering; stimulated desorption; surface cleaning techniques; surface impurities; Diodes; Inertial confinement; Ion beams; Lithium; Particle beams; Production; Surface cleaning; Surface contamination; Surface discharges; Surface impedance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-2669-5
Type :
conf
DOI :
10.1109/PLASMA.1995.531666
Filename :
531666
Link To Document :
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